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Laser Measurement Technology

BOOTH 54
E 112.3
Automated White Light Mach-Zehnder Interferometry and Microscopy
With Mach-Zehnder interferometry and microscopy we have created a new approach for the analysis of transparent materials and cells. The technology combination of transmitted light microscope and interferometer allows for the determination of layer thickness with an accuracy of one nanometer. Moreover, it allows for the mapping of refraction index distributions with a spatial resolution at the diffraction limit. The exceptionally high standards for production accuracy are realized through the use of micro actuators and piezo positioning elements. What is more, motor-driven components allow for automated adjustments and measuring.

Contact Person
Dipl.-Phys. Daniel Mahlmann
Phone +49 241 8906-172
d.mahlmann@incelltec.de
Incelltec GmbH

BOOTH 25
E 100.LMT
Laser-based Material Sorting
Fast laser identification of materials is applied to sort different materials. Individual pieces of material are transported on a conveyor belt at a speed of 3m/s and online analysed by a laser beam. Within a few microseconds the laser carries out a multi-element analysis of the material. According to the result of the laser-spectroscopic analysis, the pieces are ejected into the appropriate fraction.

This technique can be used in various industrial applications. In the recycling industry a more detailed classification becomes increasingly important with increasing recycling rates. To produce a variety of alloys using a high fraction of recycled material, it is necessary not only to separate different metals, but also to fractionate different alloys of the same metal from the waste stream. Scrap aluminum is sorted as well as other light metals or high and low alloyed steel.

This online measurement technology can also be applied to characterize and sort streams of raw material, e.g. minerals and ores, and for mix-up inspection in a production line.

Contact Person
Dr. Cord Fricke-Begemann
Phone +49 241 8906-196
cord.fricke-begemann@ilt.fraunhofer.de
Fraunhofer Institute for Laser Technology ILT

BOOTH 60
E 118
Tailoring of Freeform Optical Surfaces for Highly Customized Illumination Applications
LEDs are becoming a light source of great importance, allowing very flexible beam shaping due to their limited spatial extent. Here, the techniques of classical optics design can no longer be applied as demands on target intensity distributions and optical efficiency are particularly high. It is thus required that new concepts be developed for the design of efficient and flexible optics.

Instead of classical lens geometries, general refracting or reflecting surfaces (freeform surfaces) are used in the optical design. Their shape is established using complex mathematical algorithms which are developed at Fraunhofer ILT.

LED systems for the uniform illumination of square and rectangular areas were designed. Additionally, the flexibility of this approach was demonstrated by creating arbitrary irradiance distributions in the target plane.

Contact Person
M. Sc. Axel Bäuerle
Phone +49 241 8906-597
axel.baeuerle@ilt.fraunhofer.de
Lehrstuhl für Technologie Optischer Systeme TOS

BOOTH 55
E 112.3
Time Resolved Observation of Formation of Laser-induced Nanostructures
"Sub 100nm"-structures offer vast potential benefits in photonics, biotechnology, tribological surface design and plasmonic applications. However the dynamics of their generation are not well understood. Research in this field requires high temporal and spatial resolution. A combination of a fs-laser and an EUV-microscope system provides a toolchain for controlled and reproducible production of nanostructures. Focused fs-laser radiation causes a local modification resulting in nanostructures of high precision and reproducibility. The unique interaction processes induced by fs-laser radiation open up new markets in laser material processing and are therefore a subject of current research. Microscopy using EUV-light is capable of detecting structures on a scale down to several tens of nanometers. An EUV-microscope, consisting of a plasma-source, collector, sample handling, zoneplate and detector, has been constructed to achieve a high spatial and temporal resolution. By using a gated MCP as a detector we expect temporal and spatial resolutions < 1ns and < 100nm.

Contact Person
Dipl.-Phys. Ralf Freiberger / Dipl.-Phys. Martin Reininghaus
Phone +49 241 8906-395 / 627
ralf.freiberger@ilt.fraunhofer.de
Lehrstuhl für Technologie Optischer Systeme TOS
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